第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-DRM101000 GaN Dynamic RDON
Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
|
Hard handover <1us |
Supports resistive/ inductive loads |
Support hard/
soft handover |
Multiple-pulse output |
| Type | QT-DRM101000 |
| Advantages |
QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution |
| Main Features |
? Support FT or CP, laboratory, mass production testing ? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON ? Output capacity 10A/1000V
|
Recommend推荐产品
|
中国广东省佛山市南海国家高新区新光源产业基地光明大道16号 |
|
0757 83207313 (销售) |
|
0757 83208786 (销售) |
|
info@www.ettedu.cn |
佛山市联动科技股份有限公司 版权所有 www.ettedu.cn ? 2015 | 隐私政策 | Sitemap 粤ICP备17127080号-1
